Electron microscopes
The TSM core facility coordinates access to a number of different electron microscopes (FIB, SEM, TEM, Electron probe microanalyzer) and as well as corresponding auxiliary devices.
Focussed Ion Beam (FIB)
Zeiss Crossbeam 550L (Cryo-FIB-SEM)
- equipped with a field emission gun and two air lock systems for sample exchange for room temperature and cryo samples
- multiple detectors (Inlens SE, SESI, ESB, BSE, STEM), UniGIS System (C, PT), XEI Evactron Zephyr Plasma Cleaner, EDS/EDX detector (UltimMax 100 / AZtecEnergy Advanced)
- Kleindiek Micromanipulator for lamella lift out
- Software packages: SmartSEM, SmartFIB,Atlas, Atas 3D
Location: GUZ, Level 2, room E2P02
Contact: Dr. Stefan Fischer 07071 29 78929 email
Scanning electron microscopes (SEM)
LEO Modell 1450 VP
- Tungsten cathode
- equipped with 4-quadrant BSE detector
- EDX-System: INCA Energy 300 (Oxford) (Not applicable at the moment)
- Cathodoluminescence Model ASK SEM-CL View VIS
Location: GUZ (E2 Room 2L02)
contact: Hartmut Schulz 07071 29 72496 email
Zeiss EVO LS 10
- 1-15kV Scanning Electron microscope
- LaB6 cathode
- Backscatter detector
- Emitech K1250X Cryo preparation unit
Location: E-Bau (Auf der Morgenstelle 28), level 2, room E2H11
Contact: Monika Meinert 07071 29 76961 email
Thermo Fisher Phenom XL
- Tabletop Electron Microscope
- CeB6 electron gun
- 5 kV/20 kV observation condition
- energy dispersive spectrometer eqipped with SDD
- SE and BSE (COMPO, TOPO mode) detector
Location: GUZ, level 5, room 5E36
Contact: Dr. Sebastian Staude, phone 2973080, email
HITACHI TM3030Plus
- Tabletop Electron Microscope
- T electron gun
- 5 kV/15 kV observation condition
- energy dispersive spectrometer eqipped with SDD
- SE and BSE (COMPO, TOPO mode) detector
Location: GUZ, level 5, room 5E36
Contact: Dr. Sebastian Staude, phone 2973080, email
Transmission electron microscopes (TEM)
FEI Tecnai 10
- 80 -100kV acceleration voltage, LaB6 cathode
- equipped with a Gatan RIO 9 digital camera (3K, side-mount)
- digital compustage and Imagingsoftware allows for large scale stitching of image tiles.
Location: E-Bau (Auf der Morgenstelle 28), Level 2, room E2H08
Contact: Julia Straube 07071 29 77587 email ; Prof. Dr. Oliver Betz 07071 29 72995 email
Jeol JEM TEM 1400plus
- 120 kV accelerating voltage
- Tietz TemCam F-416 CMOS camera (4K)
- Goniometer
- CLEM Software
Location: ZMBP (Auf der Morgenstelle 32), level 3, room 3W04
Contact: Dr. Sandra Richter 07071 29 76662 email
Electron Probe Microanalyzer (EPMA)
JEOL JXA-8239
- W or LaB6 electron gun
- five wavelength-dispersive spectrometers (WDS), detectable element range Be - U
- energy dispersive spectrometer eqipped with SDD
- secondary electron (SE), backscattered electron (BE: COMPO, TOPO mode) and cathode-luminescence (CL) detector
Location: GUZ, level 2, room 2M02
Contact: Dr. Sebastian Staude, 2973080, email